Showing results: 121 - 133 of 133 items found.
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N5990A -
Keysight Technologies
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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DAQe-2000 Series -
ADLINK Technology Inc.
ADLINK DAQe-2000 series products are simultaneous-sampling multi-function PCI Express DAQ cards to meet a wide range of application requirements. The devices can simultaneously sample 4 AI channels with differential input configuration in order to achieve maximum noise elimination. They also provide 2-CH 12-bit analog outputs with waveform generation capability, which can be performed together with analog input functions. If more analog input or output channels are required, multiple cards can be synchronized through the SSI (system synchronization interface) bus. This makes the DAQe-2000 series ideal for the stimulus/response test.
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Teledyne LeCroy
Teledyne LeCroy offers a broad spectrum of PCI Express protocol analyzer platforms (Summit T516, Summit T54, Summit M5x, Summit™ T416, Summit T48, Summit™ T3-16, Summit T3-8, Summit T34, Summit T28, and Summit T24). The Summit T516, T54 and M5x are Teledyne LeCroy’s leading edge products supporting PCIe 5.0 and CXL specifications. The Summit T416, T48, T34, T3-16 and T3-16 are Teledyne LeCroys midrange protocol analyzers. These protocol analyzers are at the forefront of SSD and computer storage analysis, test and compliance. The Summit T28 and T24 are entry level protocol analysis tools for development and test at PCIe 2.0.
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781056-01 -
NI
The PXIe‑6363 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6363 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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785808-01 -
NI
PXIe, 32 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe-6349 offers analog I/O, digital I/O, and four 32-bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe-6349 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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783633-01 -
NI
PXIe, 144 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6365 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6365 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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783632-01 -
NI
PXIe, 80 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6355 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6355 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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783631-01 -
NI
PXIe, 80 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6345 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6345 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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783634-01 -
NI
PXIe, 208 AI (16-Bit, 3.8 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6375 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6375 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781052-01 -
NI
PXIe, 16 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6341 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6341 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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781055-01 -
NI
PXIe, 16 AI (16-Bit, 2 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6361 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6361 is well-suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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785813-01 -
NI
PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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ATE QT2256-640 PXI -
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
